sequential wavelength dispersive XRF spectromETER

High Throughput, High-Precision WD-XRF Spectrometer - Transforming the way of Instrumental analysis

The NX series WD-XRF is a sequential wavelength dispersive X-ray fluorescence spectrometer for high throughput, high-precision elemental analysis in geology, materials science and environmental analysis. This instrument provides the exceptionally high resolution and sensitivity required for analyzing trace elements in complex samples. The CNX-808 enables the precise determination of oxygen, nitrogen and carbon as well as the quantification of other elements and is ideal for applications in metal processing, research and industry.

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Specifications

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Specifications

Power: 4 kW, offers powerful and stable analyses for complex element determinations.
Spectral range: 0.01-50 keV, allows analysis of major and trace elements.
Detectors: Wavelength dispersive X-ray fluorescence detectors (WDXRF) for exceptional sensitivity and precision in elemental analysis
Resolution: 0.01 nm, ensures detailed differentiation of elements with similar properties.
Sample acquisition: Automated system, optimized for high throughput and efficient sample processing.
Analysis time: Variable, depending on sample complexity and trace analysis requirements.
Calibration: Fully automated calibration and maintenance routines, reducing user effort and ensuring consistent precision.
Software: User-friendly interface with advanced features for data analysis, reporting and process optimization.

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Functions

FAQ - Frequently asked

Specifications

High resolution and sensitivity: Enables detailed element analyses even in complex sample matrices.
Precise element determination: Perfectly suited for comprehensive material testing and environmentally relevant trace analyses.
User-friendly software: Simplifies operation and enables efficient data analysis with advanced visualization tools.
Robust design: Optimized for long-term use in laboratories and demanding field environments.
Automated processes: Reduces user effort and increases process stability for consistent analysis results.
Advanced reporting: Provides flexible options for documentation and detailed evaluation of measurement results.
Ease of maintenance: Enables quick and easy maintenance processes to maximize uptime and ensure consistent performance.

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FAQ - Frequently asked

Which elements can be precisely analyzed with the NX series WD-XRF?

The NX series WD-XRF wavelength dispersive X-ray fluorescence spectrometer enables the precise analysis of major and trace elements, as well as heavy metals such as chromium, lead and cadmium, and is therefore ideal for material and environmental analysis.

How does the NX series WD-XRF support quality control in metal processing?

With its high resolution and automated calibration, the NX series WD-XRF enables reliable control of metal compositions, ensuring precise quality control and compliance with industry standards.

What technologies does the NX series WD-XRF use to analyze oxygen, nitrogen and carbon?

The NX series WD-XRF uses X-ray technology to determine the composition of a wide range of samples. A combination of a proportional counter and a scintillation counter achieves a very low detection limit.

What advantages does the automated calibration of the NX series WD-XRF offer for industrial applications?

The automated calibration of the NX series WD-XRF minimizes user effort, ensures consistent measurement accuracy and optimizes efficiency in industrial applications, especially in metal and environmental analysis.

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sequential wavelength dispersive XRF spectromETER

High Throughput, High-Precision WD-XRF Spectrometer - Transforming the way of Instrumental analysis

Technical info

Specifications

FAQ - Frequently asked

Specifications

Functions

FAQ - Frequently asked

Specifications

FAQ - Frequently asked

FAQ - Frequently asked

FAQ - Frequently asked

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