ICP-OES Dual View Atomic emission spectrometer

 Spectral range: 165-950 nm, ideal for major and trace element analysis in metallurgy and environmental analysis.

• Power: 500-1600 W, flexibly adaptable depending on sample requirements and analysis complexity.
• Detectors: High resolution CCD detectors, enabling precise and reliable elemental analysis.
• Resolution: 0.007nm@200nm, ideal for detailed element differentiation and analysis.
• Sample acquisition: Automated sample changers ensure high efficiency at high throughput rates.
• Analysis time: Fast and efficient, usually within a few minutes per sample.
• Calibration: Fully automated calibration and verification, minimizes user effort and increases uptime.
• Software: Intuitive and user-friendly interface with advanced features for data analysis and reporting.

• Dual View technology: Increases sensitivity and precision for accurate elemental analysis in metallurgy and environmental analysis.
• Detailed elemental analysis: Perfect for precise material studies and elemental analysis.
• User-friendly software: Supports intuitive operation and offers advanced options for data analysis and reporting.
• Robust and durable design: Designed for continuous use in demanding laboratory and field environments, even under heavy load.
• Automated processes: Reduces user effort, increases efficiency and ensures consistent analysis results.
• Advanced reporting: Comprehensive functions for documentation and detailed evaluation of measurement results.
• Ease of maintenance: Quick and easy maintenance processes that ensure maximum uptime and reliable performance.